Field Emission Scanning Microscope (FE-SEM) Laboratory
official magnification capability of up to 1,000,000× and allows the investigation of structural features and particles as small as approximately 10 nm
The FE-SEM Laboratory is equipped with a TESCAN MIRA3 Field Emission Scanning Electron Microscope, a versatile platform designed for multipurpose imaging and analytical workflows. The system combines high-current beam stability and In- Beam technology to deliver reliable high-resolution imaging and advanced microstructural characterization.
The microscope is equipped with Secondary Electron (SE), Backscattered Electron (BSE), and In-Beam detectors, as well as an Energy Dispersive X-ray Spectroscopy (EDS) analyzer, enabling detailed surface morphology studies, compositional contrast imaging, and elemental analysis.
The TESCAN MIRA3 features an official magnification capability of up to 1,000,000× and allows the investigation of structural features and particles as small as approximately 10 nm. The system is well suited for research and applications in materials science, nanotechnology, geology, electronics, energy, environmental science, and related fields.
Laboratory Capabilities
imaging & Microscopy
- High-Resolution Imaging
- Microstructural Analysis
- Failure Investigation
- Materials Characterization
Elemental Analysis
- Elemental Analysis with EDS
- Point & Line Scan Analysis
- Elemental Mapping
- Phase Characterization
Sample preparation
- SEM Specimen Preparation
- Mounting & Conductive Coating
- Cross-Section Preparation
- Fracture Specimen Preparation
Coat Sputtering
- Conductive Gold Coating
- Controlled Coating Thickness
- Charge Reduction
- Enhanced SEM Imaging
Application Area
