Scanning Electron Microscopy (SEM) is applied in geoscience and mineral analysis to investigate the microstructural and compositional characteristics of geological materials prepared as polished thin sections or petrographic sections previously examined under polarized light microscopy. This technique enables high-resolution imaging and phase differentiation within complex mineral systems, allowing the identification of individual mineral phases and their textural relationships. In addition to morphological characterization, SEM is coupled with elemental analysis (EDS) to determine the distribution of major, minor, and trace elements, including rare earth elements (REEs), and to evaluate their association with specific mineral phases. This approach is particularly effective in assessing ore mineralogy, elemental hosting phases, and micro-scale geochemical variability within geological samples.